default search action
"Investigation of the shift of hot spot in lateral diffused LDMOS under ESD ..."
Qinsong Qian et al. (2010)
- Qinsong Qian, Weifeng Sun, Jing Zhu, Longxing Shi:
Investigation of the shift of hot spot in lateral diffused LDMOS under ESD conditions. Microelectron. Reliab. 50(12): 1935-1941 (2010)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.