"Characterization of charge trapping in ..."

Giuseppina Puzzilli et al. (2007)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2007.01.040

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/PuzzilliGIRH07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/PuzzilliGIRH07
Giuseppina Puzzilli, Bogdan Govoreanu, Fernanda Irrera, Maarten Rosmeulen, Jan Van Houdt:
Characterization of charge trapping in SiO₂/Al₂O₃ dielectric stacks by pulsed C-V technique. Microelectron. Reliab. 47(4-5): 508-512 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.