"An in-situ numerical-experimental approach for fatigue delamination ..."

Emad A. Poshtan et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.03.017

access: closed

type: Journal Article

metadata version: 2023-09-30

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Emad A. Poshtan, Sven Rzepka, Christian Silber, Bernhard Wunderle:
An in-situ numerical-experimental approach for fatigue delamination characterization in microelectronic packages. Microelectron. Reliab. 62: 18-25 (2016)

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