"Morphological and electrical comparison of Ti and Ta based ohmic contacts ..."

Alexander Pooth et al. (2017)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2016.11.002

access: closed

type: Journal Article

metadata version: 2024-10-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/PoothBRHPTMWCUK17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/PoothBRHPTMWCUK17
Alexander Pooth, Johan Bergsten, Niklas Rorsman, Hassan Hirshy, R. Perks, Paul J. Tasker, Trevor Martin, Richard F. Webster, Dave Cherns, Michael J. Uren, Martin Kuball:
Morphological and electrical comparison of Ti and Ta based ohmic contacts for AlGaN/GaN-on-SiC HFETs. Microelectron. Reliab. 68: 2-4 (2017)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.