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"Nanometer-scale leakage measurements in high vacuum on de-processed high-k ..."
W. Polspoel et al. (2008)
- W. Polspoel, Wilfried Vandervorst, Lidia Aguilera, Marc Porti
, Montserrat Nafría
, Xavier Aymerich
:
Nanometer-scale leakage measurements in high vacuum on de-processed high-k capacitors. Microelectron. Reliab. 48(8-9): 1521-1524 (2008)
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