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"Some features of degradation in bipolar transistors at different test ..."
Aleksandr S. Petrov, Viktor N. Ulimov (2012)
- Aleksandr S. Petrov, Viktor N. Ulimov:
Some features of degradation in bipolar transistors at different test conditions for total ionizing dose effect. Microelectron. Reliab. 52(9-10): 2435-2437 (2012)
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