"Some features of degradation in bipolar transistors at different test ..."

Aleksandr S. Petrov, Viktor N. Ulimov (2012)

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DOI: 10.1016/J.MICROREL.2012.06.080

access: closed

type: Journal Article

metadata version: 2020-02-22

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Aleksandr S. Petrov, Viktor N. Ulimov:
Some features of degradation in bipolar transistors at different test conditions for total ionizing dose effect. Microelectron. Reliab. 52(9-10): 2435-2437 (2012)

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