"Characterization and analysis of electrical trap related effects on the ..."

Sébastien Petitdidier et al. (2015)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2015.06.070

access: closed

type: Journal Article

metadata version: 2021-07-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/PetitdidierBGTM15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/PetitdidierBGTM15
Sébastien Petitdidier, Fanny Berthet, Yannick Guhel, Jean-Lionel Trolet, Philippe Mary, Christophe Gaquière, Bertrand Boudart:
Characterization and analysis of electrical trap related effects on the reliability of AlInN/GaN HEMTs. Microelectron. Reliab. 55(9-10): 1719-1723 (2015)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.