"Low voltage stress induced leakage current and time to breakdown in ..."

Christian Petit, Damien Zander (2007)

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DOI: 10.1016/J.MICROREL.2006.05.006

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type: Journal Article

metadata version: 2022-06-17

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Christian Petit, Damien Zander:
Low voltage stress induced leakage current and time to breakdown in ultra-thin (1.2-2.3nm) oxides. Microelectron. Reliab. 47(2-3): 401-408 (2007)

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