"X-ray ion mobility spectrometer."

V. S. Pershenkov et al. (2006)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2005.07.003

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/PershenkovTBRM06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/PershenkovTBRM06
V. S. Pershenkov, A. D. Tremasov, V. V. Belyakov, A. U. Razvalyaev, V. S. Mochkin:
X-ray ion mobility spectrometer. Microelectron. Reliab. 46(2-4): 641-644 (2006)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.