"VLSI functional analysis by dynamic emission microscopy."

Philippe Perdu et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.077

access: closed

type: Journal Article

metadata version: 2020-02-22

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Philippe Perdu, Jerome Di-Battista, Sylvain Dudit, Tomonori Nakamura:
VLSI functional analysis by dynamic emission microscopy. Microelectron. Reliab. 50(9-11): 1431-1435 (2010)

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