"Degradation mapping in high power IGBT modules using four-point probing."

Kristian Bonderup Pedersen et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.05.011

access: closed

type: Journal Article

metadata version: 2023-09-30

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Kristian Bonderup Pedersen, Lotte Haxen Østergaard, Pramod Ghimire, Vladimir N. Popok, Kjeld Pedersen:
Degradation mapping in high power IGBT modules using four-point probing. Microelectron. Reliab. 55(8): 1196-1204 (2015)

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