"Designing in reliability in advanced CMOS technologies."

C. R. Parthasarathy et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.07.012

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type: Journal Article

metadata version: 2024-11-04

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C. R. Parthasarathy, Mickael Denais, Vincent Huard, G. Ribes, David Roy, Chloe Guérin, F. Perrier, E. Vincent, Alain Bravaix:
Designing in reliability in advanced CMOS technologies. Microelectron. Reliab. 46(9-11): 1464-1471 (2006)

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