"Transient effects on high voltage diode stack under reverse bias."

Václav Papez et al. (2003)

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DOI: 10.1016/S0026-2714(03)00028-3

access: closed

type: Journal Article

metadata version: 2020-07-02

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Václav Papez, B. Kojecký, J. Kozísek, J. Hejhal:
Transient effects on high voltage diode stack under reverse bias. Microelectron. Reliab. 43(4): 557-564 (2003)

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