"Scaling DC lifetests on GaN HEMT to RF conditions."

Bruce M. Paine (2015)

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DOI: 10.1016/J.MICROREL.2015.09.024

access: closed

type: Journal Article

metadata version: 2020-02-22

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Bruce M. Paine:
Scaling DC lifetests on GaN HEMT to RF conditions. Microelectron. Reliab. 55(12): 2499-2504 (2015)

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