"Physically based models of electromigration: From Black's equation to ..."

R. L. de Orio, Hajdin Ceric, Siegfried Selberherr (2010)

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DOI: 10.1016/J.MICROREL.2010.01.007

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type: Journal Article

metadata version: 2021-10-14

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R. L. de Orio, Hajdin Ceric, Siegfried Selberherr:
Physically based models of electromigration: From Black's equation to modern TCAD models. Microelectron. Reliab. 50(6): 775-789 (2010)

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