"Evaluation of performance-reliability trade-offs in a Si-Ge BiCMOS process ..."

Barry O'Connell, Prasad Chaparala, Bhola Mehrotra (2004)

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DOI: 10.1016/J.MICROREL.2004.04.013

access: closed

type: Journal Article

metadata version: 2020-02-22

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Barry O'Connell, Prasad Chaparala, Bhola Mehrotra:
Evaluation of performance-reliability trade-offs in a Si-Ge BiCMOS process using fast wafer level techniques. Microelectron. Reliab. 44(8): 1263-1268 (2004)

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