"New NBTI models for degradation and relaxation kinetics valid over ..."

D. Nouguier et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.04.009

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type: Journal Article

metadata version: 2022-01-03

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D. Nouguier, X. Federspiel, Gérard Ghibaudo, M. Rafik, David Roy:
New NBTI models for degradation and relaxation kinetics valid over extended temperature and stress/recovery ranges. Microelectron. Reliab. 87: 106-112 (2018)

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