"The combinational or selective usage of the laser SQUID microscope, the ..."

Kiyoshi Nikawa et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.06.060

access: closed

type: Journal Article

metadata version: 2020-02-22

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Kiyoshi Nikawa, Masatsugu Yamashita, Toru Matsumoto, Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae:
The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization. Microelectron. Reliab. 51(9-11): 1624-1631 (2011)

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