"Simulation and experimental characterization of reservoir and via layout ..."

H. V. Nguyen et al. (2002)

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DOI: 10.1016/S0026-2714(02)00162-2

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/mr/NguyenSWMK02
H. V. Nguyen, Cora Salm, R. Wenzel, A. J. Mouthaan, Fred G. Kuper:
Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime. Microelectron. Reliab. 42(9-11): 1421-1425 (2002)

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