"Performance vs. reliability adaptive body bias scheme in 28 nm & 14 nm ..."

Cheikh Ndiaye et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.085

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type: Journal Article

metadata version: 2023-09-30

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Cheikh Ndiaye, Vincent Huard, X. Federspiel, Florian Cacho, Alain Bravaix:
Performance vs. reliability adaptive body bias scheme in 28 nm & 14 nm UTBB FDSOI nodes. Microelectron. Reliab. 64: 158-162 (2016)

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