"Amorphous silicon technology for large area digital X-ray and optical imaging."

Arokia Nathan et al. (2002)

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DOI: 10.1016/S0026-2714(02)00024-0

access: closed

type: Journal Article

metadata version: 2020-02-22

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Arokia Nathan, Byung-kyu Park, Qinghua Ma, Andrei Sazonov, John A. Rowlands:
Amorphous silicon technology for large area digital X-ray and optical imaging. Microelectron. Reliab. 42(4-5): 735-746 (2002)

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