"Influence of the turn-on mechanism on TRIACs' reliability: di/dt thermal ..."

Stéphane Moreau et al. (2002)

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DOI: 10.1016/S0026-2714(02)00208-1

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type: Journal Article

metadata version: 2020-02-22

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Stéphane Moreau, Stéphane Forster, Thierry Lequeu, Robert Jérisian:
Influence of the turn-on mechanism on TRIACs' reliability: di/dt thermal fatigue study in Q1 compared to Q2. Microelectron. Reliab. 42(9-11): 1663-1666 (2002)

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