"Low temperature FIB cross section: Application to indium micro bumps."

Lionel Dantas de Morais, Sophie Chevalliez, Stephanie Mouleres (2014)

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DOI: 10.1016/J.MICROREL.2014.08.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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Lionel Dantas de Morais, Sophie Chevalliez, Stephanie Mouleres:
Low temperature FIB cross section: Application to indium micro bumps. Microelectron. Reliab. 54(9-10): 1802-1805 (2014)

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