"Wear-out, breakdown occurrence and failure detection in 18-25 Å ..."

Frederic Monsieur et al. (2001)

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DOI: 10.1016/S0026-2714(01)00064-6

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type: Journal Article

metadata version: 2020-02-22

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Frederic Monsieur, E. Vincent, G. Pananakakis, Gérard Ghibaudo:
Wear-out, breakdown occurrence and failure detection in 18-25 Å ultrathin oxides. Microelectron. Reliab. 41(7): 1035-1039 (2001)

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