"Analysis and test procedures for NOR flash memory defects."

Mohammad Gh. Mohammad, Kewal K. Saluja (2008)

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DOI: 10.1016/J.MICROREL.2008.01.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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Mohammad Gh. Mohammad, Kewal K. Saluja:
Analysis and test procedures for NOR flash memory defects. Microelectron. Reliab. 48(5): 698-709 (2008)

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