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"Short-circuit robustness test and in depth microstructural analysis study ..."

Safa Mbarek et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.07.002

access: closed

type: Journal Article

metadata version: 2022-03-23

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Safa Mbarek, Pascal Dherbécourt, Olivier Latry, François Fouquet:
Short-circuit robustness test and in depth microstructural analysis study of SiC MOSFET. Microelectron. Reliab. 76-77: 527-531 (2017)

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