"Window for better reliability of nitride heterostructure field effect ..."

Arvydas Matulionis et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.071

access: closed

type: Journal Article

metadata version: 2023-09-30

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Arvydas Matulionis, Juozapas Liberis, Emilis Sermuksnis, Linas Ardaravicius, Artur Simukovic, Cemil Kayis, Congyong Zhu, Romualdo Ferreyra, Vitaliy Avrutin, Ümit Özgür, Hadis Morkoç:
Window for better reliability of nitride heterostructure field effect transistors. Microelectron. Reliab. 52(9-10): 2149-2152 (2012)

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