"Correlation between localized strain and damage in shear-loaded Pb-free ..."

M. A. Matin et al. (2007)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2006.09.025

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/MatinTVG07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/MatinTVG07
M. A. Matin, J. G. A. Theeven, W. P. Vellinga, Marc G. D. Geers:
Correlation between localized strain and damage in shear-loaded Pb-free solders. Microelectron. Reliab. 47(8): 1262-1272 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.