"Fast wafer level reliability monitoring as a tool to achieve automotive ..."

Andreas Martin et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.120

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type: Journal Article

metadata version: 2021-02-11

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Andreas Martin, Rolf-Peter Vollertsen, A. Mitchell, M. Traving, D. Beckmeier, H. Nielen:
Fast wafer level reliability monitoring as a tool to achieve automotive quality for a wafer process. Microelectron. Reliab. 64: 2-12 (2016)

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