"Ramped current stress for fast and reliable wafer level reliability ..."

Andreas Martin, Jochen von Hagen, Glenn B. Alers (2003)

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DOI: 10.1016/S0026-2714(03)00188-4

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type: Journal Article

metadata version: 2021-02-11

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Andreas Martin, Jochen von Hagen, Glenn B. Alers:
Ramped current stress for fast and reliable wafer level reliability monitoring of thin gate oxide reliability. Microelectron. Reliab. 43(8): 1215-1220 (2003)

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