"Reliability of metamorphic HEMTs on GaAs substrates."

Phil F. Marsh et al. (2002)

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DOI: 10.1016/S0026-2714(02)00063-X

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type: Journal Article

metadata version: 2022-04-08

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Phil F. Marsh, Colin S. Whelan, William E. Hoke, Robert E. Leoni III, Thomas E. Kazior:
Reliability of metamorphic HEMTs on GaAs substrates. Microelectron. Reliab. 42(7): 997-1002 (2002)

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