"SCR-based ESD protection in nanometer SOI technologies."

Olivier Marichal et al. (2007)

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DOI: 10.1016/J.MICROREL.2006.11.011

access: closed

type: Journal Article

metadata version: 2020-02-22

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Olivier Marichal, Geert Wybo, Benjamin Van Camp, Pieter Vanysacker, Bart Keppens:
SCR-based ESD protection in nanometer SOI technologies. Microelectron. Reliab. 47(7): 1060-1068 (2007)

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