"Soft error rate comparison of 6T and 8T SRAM ICs using mono-energetic ..."

Daniel Malagón et al. (2017)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2017.07.093

access: closed

type: Journal Article

metadata version: 2024-10-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/MalagonBTGPFMQS17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/MalagonBTGPFMQS17
Daniel Malagón, Sebastià A. Bota, Gabriel Torrens, Xavier Gili, Javier Praena, B. Fernández, Miguel Macías, José Manuel Quesada, Carlos Guerrero Sanchez, María del Carmen Jiménez-Ramos, Javier García López, José Luis Merino, Jaume Segura:
Soft error rate comparison of 6T and 8T SRAM ICs using mono-energetic proton and neutron irradiation sources. Microelectron. Reliab. 78: 38-45 (2017)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.