"SCRAP: Sequential circuits reliability analysis program."

Seyyed Javad Seyyed Mahdavi, Karim Mohammadi (2009)

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DOI: 10.1016/J.MICROREL.2009.06.001

access: closed

type: Journal Article

metadata version: 2020-02-22

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Seyyed Javad Seyyed Mahdavi, Karim Mohammadi:
SCRAP: Sequential circuits reliability analysis program. Microelectron. Reliab. 49(8): 924-933 (2009)

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