"Evolutionary derivation of optimal test sets for neural network based ..."

Seyyed Javad Seyyed Mahdavi, Karim Mohammadi (2009)

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DOI: 10.1016/J.MICROREL.2008.12.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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Seyyed Javad Seyyed Mahdavi, Karim Mohammadi:
Evolutionary derivation of optimal test sets for neural network based analog and mixed signal circuits fault diagnosis approach. Microelectron. Reliab. 49(2): 199-208 (2009)

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