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"Investigation of degradation mechanisms in low-voltage p-channel power ..."
Paolo Magnone, Giacomo Barletta, A. Magrì (2018)
- Paolo Magnone, Giacomo Barletta, A. Magrì:
Investigation of degradation mechanisms in low-voltage p-channel power MOSFETs under High Temperature Gate Bias stress. Microelectron. Reliab. 88-90: 438-442 (2018)
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