"Single-event transient effects on dynamic comparator in 28 nm FDSOI ..."

Nilson Maciel et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.114

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type: Journal Article

metadata version: 2025-01-19

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Nilson Maciel, Elaine Crespo Marques, Lirida A. B. Naviner, Hao Cai:
Single-event transient effects on dynamic comparator in 28 nm FDSOI CMOS technology. Microelectron. Reliab. 88-90: 965-968 (2018)

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