"A physical based model to predict performance degradation of FinFET ..."

Chenyue Ma et al. (2011)

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DOI: 10.1016/J.MICROREL.2010.08.023

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type: Journal Article

metadata version: 2024-08-04

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Chenyue Ma, Lining Zhang, Chenfei Zhang, Xiufang Zhang, Jin He, Xing Zhang:
A physical based model to predict performance degradation of FinFET accounting for interface state distribution effect due to hot carrier injection. Microelectron. Reliab. 51(2): 337-341 (2011)

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