"Modelling mobility degradation due to remote Coulomb scattering from ..."

G. S. Lujan et al. (2005)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2004.11.046

access: closed

type: Journal Article

metadata version: 2023-07-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/LujanMRKGHM05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/LujanMRKGHM05
G. S. Lujan, Wim Magnus, L.-Å. Ragnarsson, Stefan Kubicek, Stefan De Gendt, Marc M. Heyns, Kristin De Meyer:
Modelling mobility degradation due to remote Coulomb scattering from dielectric charges and its impact on MOS device performance. Microelectron. Reliab. 45(5-6): 794-797 (2005)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.