"Dynamic NBTI characteristics of PMOSFETs with PE-SiN capping."

C. Y. Lu, Horng-Chih Lin, Y. J. Lee (2007)

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DOI: 10.1016/J.MICROREL.2006.06.004

access: closed

type: Journal Article

metadata version: 2023-06-21

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C. Y. Lu, Horng-Chih Lin, Y. J. Lee:
Dynamic NBTI characteristics of PMOSFETs with PE-SiN capping. Microelectron. Reliab. 47(6): 924-929 (2007)

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