"Advanced electronic prognostics through system telemetry and pattern ..."

Leon Lopez (2007)

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DOI: 10.1016/J.MICROREL.2007.02.018

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type: Journal Article

metadata version: 2020-02-22

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Leon Lopez:
Advanced electronic prognostics through system telemetry and pattern recognition methods. Microelectron. Reliab. 47(12): 1865-1873 (2007)

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