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"Using scanning acoustic microscopy and LM-BP algorithm for defect ..."
Fan Liu et al. (2017)
- Fan Liu, Lei Su, Mengying Fan, Jian Yin, Zhenzhi He, Xiangning Lu:
Using scanning acoustic microscopy and LM-BP algorithm for defect inspection of micro solder bumps. Microelectron. Reliab. 79: 166-174 (2017)
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