"Ku band damage characteristics of GaAs pHEMT induced by a front-door ..."

Yang Liu et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.09.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yang Liu, Changchun Chai, Qingyang Fan, ChunLei Shi, Xiaowen Xi, Xinhai Yu, Yintang Yang:
Ku band damage characteristics of GaAs pHEMT induced by a front-door coupling microwave pulse. Microelectron. Reliab. 66: 32-37 (2016)

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