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"Leakage current mechanism and effect of Y2O3 doped ..."
K. C. Lin et al. (2015)
- K. C. Lin, P. C. Juan, C. H. Liu, Mu-Chun Wang, C. H. Chou:
Leakage current mechanism and effect of Y2O3 doped with Zr high-K gate dielectrics. Microelectron. Reliab. 55(11): 2198-2202 (2015)
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