"Anomalous latchup failure induced by on-chip ESD protection circuit in a ..."

I-Cheng Lin et al. (2003)

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DOI: 10.1016/S0026-2714(03)00139-2

access: closed

type: Journal Article

metadata version: 2020-02-22

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I-Cheng Lin, Chih-Yao Huang, Chuan-Jane Chao, Ming-Dou Ker:
Anomalous latchup failure induced by on-chip ESD protection circuit in a high-voltage CMOS IC product. Microelectron. Reliab. 43(8): 1295-1301 (2003)

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