"Temperature-dependent resistive switching characteristics for Au/n-type ..."

Yow-Jon Lin, Yu-Ju Chu (2016)

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DOI: 10.1016/J.MICROREL.2016.05.012

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yow-Jon Lin, Yu-Ju Chu:
Temperature-dependent resistive switching characteristics for Au/n-type CuAlO_x/heavily doped p-type Si devices. Microelectron. Reliab. 63: 31-36 (2016)

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