"Behavior of hot carrier generation in power SOI LDNMOS with shallow trench ..."

Jie Liao, Cher Ming Tan, Geert Spierings (2009)

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DOI: 10.1016/J.MICROREL.2009.06.044

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jie Liao, Cher Ming Tan, Geert Spierings:
Behavior of hot carrier generation in power SOI LDNMOS with shallow trench isolation (STI). Microelectron. Reliab. 49(9-11): 1038-1043 (2009)

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