"Electromagnetic susceptibility characterization of double SOI device."

Binhong Li et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.121

access: closed

type: Journal Article

metadata version: 2022-12-18

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  - https://dblp.org/rec/journals/mr/LiZWZSGGL16
Binhong Li, Kai Zhao, Jianfei Wu, Xing Zhao, Jianwei Su, Jiantou Gao, Chuang Gao, Jun Luo:
Electromagnetic susceptibility characterization of double SOI device. Microelectron. Reliab. 64: 168-171 (2016)

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