"A novel correlative model of failure mechanisms for evaluating MEMS ..."

Yaqiu Li et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.016

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yaqiu Li, Yufeng Sun, Weiwei Hu, Zili Wang:
A novel correlative model of failure mechanisms for evaluating MEMS devices reliability. Microelectron. Reliab. 64: 669-675 (2016)

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