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"Random telegraph signal: A sensitive and nondestructive tool for gate ..."
Cédric Leyris et al. (2007)
- Cédric Leyris, Frédéric Martinez, M. Valenza, Alain Hoffmann, J. C. Vildeuil:
Random telegraph signal: A sensitive and nondestructive tool for gate oxide single trap characterization. Microelectron. Reliab. 47(4-5): 573-576 (2007)
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